DRDO CEPTAM Admit Card 2022 for ITI Technician A Jobs Tier 1 Exam 2022
DRDO
Technician-A Tier-1 Exam date, Admit Card: DRDO
has released admit Cards for the DRDO CEPTAM-10 Technician-A Tier 1 Exam 2022.
DRDO Announced Technician-A tier-1 exam date. Tier-1 Exam will be conducted
from 06-01-2023 to 11-01-2023. Exam will be conducted in all over India exam
centers. DRDO CEPTAM-10 Technician-A Exam admit card is available for download
at official website of DRDO www.DRDO.gov.in under CEPTAM Advertisement. Admit
Card release date is 23-12-2022. You have to download the admit card from the
official website only. Admit Card is available up to 11-01-2023. This DRDO
CEPTAM Technician A exam for the available 826 ITI jobs in DRDO. DRDO for this
Technician-A Exam 2022 is Computer Based Test. Tier 2 is trade test for Tier 1
qualifiers. DRDO Technician-A Tier-1 exam pattern is updated below.
DRDO CEPTAM Technician-A Tier-1 Exam Admit Card, Exam Date
DRDO Technician-A Exam Important dates:
|
DRDO Technician-A Admit Card
available date |
23-12-2022 |
|
DRDO Technician-A Tier-1 Exam date
is |
06-01-2023 to 11-01-2023 |
|
DRDO Official website |
DRDO.gov.in |
DRDO Technician-A Exam
Date Notification
DRDO CEPTAM Technician Tier-1 Exam Pattern:
DRDO Technician Exam will be
conducted for 120 marks.
Total 120 questions will be given.
Exam duration is 90 minutes.
Section A-40 Marks
Section-A Subjects are: Quantitative ability/aptitude, General
intelligence & Reasoning ability, General awareness, English language
(basic knowledge)
Section B-80 Marks ITI Level Subject
DRDO CEPTAM Technician Tier 1 Admit Card 2022:
DRDO has released ITI Technician
jobs exam admit card on 23-12-2022.
Step 1: Open DRDO website
drdo.gov.in
Step 2: Check on CEPTAM-10/DRTC
Step 3: Right side you can see admit
card for Tier 1CBT Tech A link. Click on it.
Step 4: Click on it, a new page will
open. Enter the application number and date of birth, captcha code and click
submit.
Step 5: Your admit card will open in
new page. Download and save it and take a printout.
